27-763 Foundations of Electron Microscopy

12 units, Carnegie Mellon University

This course provides an indepth overview of both scanning and transmission electron microscopy methods used in materials research for the characterization of microstructure and crystallography. The course begins with basic quantum mechanics at the level needed to describe electron scattering phenomena in solids, and introduces the basic Schrodinger equation along with several numerical procedures for its solution. Topics covered will at a minimum include atomic scattering and form factors, dynamical electron scattering, conventional and convergent beam electron diffraction, defect contrast imaging, electron backscatter diffraction, electron channeling and channeling contrast imaging, Monte Carlo simulations of electron trajectories, inelastic scattering, and an introduction to 3D characterization techniques, including serial sectioning and tomography. Throughout the course, the emphasis will be on the underlying models students will be expected to participate in practical simulation sessions.

Prerequisites: 27-740

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