27-750 Advanced Characterization and Microstructural Analysis

12 units, Carnegie Mellon University

This course gives tools for measuring and analyzing material microstructures with a special emphasis on crystallographic orientation texture. Techniques covered include xray pole figures, orientation distribution functions odfs, electron back scatter diffraction EBSD. Topics include crystal and sample symmetry, elastic anisotropy, plastic anisotropy, mathematics of rotations, tensors, use of software packages popLA, LApp. Suitable for wide range of backgrounds although familiarity with basic concepts of crystallography and mechanical behavior is helpful. Prerequisite permission of instructor.

Prerequisites: none listed

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