27-740 Practical Methods in Scanning Electron Microscopy
6 units, Carnegie Mellon University
This course is designed to provide instrument training on scanning electron microscopes in the Materials Characterization Facility MCF. Emphasis will be placed on acquiring the basic skills needed to successfully operate this type of microscopes this will be achieved by a combination of lectures and handson lab sessions. Lectures will provide the necessary background to understand electron scattering techniques, including electron diffraction, secondary and backscattered electron imaging, electron backscatter diffraction, and energy dispersive xray spectroscopy. Lab sessions will inform the student on standard operating procedures for the techniques discussed in the lecture portion of the course. At the end of the course, the student is expected to demonstrate the ability to independently use the scanning electron microscope for basic operations successful demonstration of such skills will lead to certification for dayuse of scanning electron microscopes in the MCF.
Prerequisites: none listed
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