27-707 SPECIAL TOPICS: Advanced X-Ray Scattering Techniques

6 units, Carnegie Mellon University

Xray diffraction XRD and related xray scattering techniques have a long history of use in the structural characterization of materials. This is due, in part, to the fact that xrays have wavelengths comparable to interatomic spacings and that their interaction with materials are generally nondestructive. This course is primarily lab based and will focus on experimental techniques that build off fundamental understanding of crystal structure and xray diffraction note that either graduate or undergraduate level structure of materials is a sufficient pre requisite. Possible topics will include powder XRD, single crystal XRD, preferred texture, thin film analysis, xray reflectivity XRR, epitaxy characterization, smallangle xray scattering SAXS, defect analyses, and high resolution XRD with support from various software packages. The course will leverage equipment in the new xray lab contained within the materials characterization facility MCF. Lab groups will meet every other week over the course of a full semester with separate timeslots for lecture and discussion.

Prerequisites: none listed

Offered: Spring 2027

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